EMC Society
Scope and Contents
This sub-series consists of materials related to Donald Heirman’s contributions to the Institute of Electrical and Electronics Engineers (IEEE). He became an IEEE member in 1974 through the IEEE NJ Coast EMC Chapter of the EMC Society, where he assisted with the Scanner Newsletter, became an EMC Society board member, and attended EMC conferences, such as the International Conference of Communiations (ICC). In 1980, he served as president of the EMC Society. Upon finishing his term, he joined the EMC Society Standards Committee as chairman, where he helped develop EMC standards and organize IEEE International Symposiums. He remained in the position for 17 years.
He became the president of the IEEE Standards Association (SA) in 2005, where he led the development of a broader range of international standards relating to healthcare, consumer electronics, and emerging technologies. As SA president, he subsequently became a member of the IEEE Board of Directors. Throughout the 2000s and 2010s, he proceeded to serve on several board of directors committees, including the Executive Committee, Ethics and Member Conduct Committee, Product Services and Publications Board, Nominations and Appointments Committee, and Marketing and Sales Committee.
This sub-series contains meeting minutes, newsletters, correspondence, presentations, and conference proceedings.
Dates
- Creation: 1973 - 2019
Creator
- From the Collection: Heirman, Donald N., 1940-2020 (Person)
Language of Materials
Collection material is in English.
Access Information
The collection is open for research. IEEE Nominations and Appointments Committee papers have been restricted until 2095 due to private discussion of IEEE members. U.S. Navy papers have been restricted until 2095 due to presence of personally identifiable information in papers.
Extent
From the Sub-Series: 29.35 Cubic Feet (26 cubic foot boxes, nine letter-size full-width manuscript boxes, 764 folders, and one flat folder)
- Transverse Electro Magnetic (TEM) Cell Seminar
- Comments on the Trial-use Standard P734/C37.90.2
- Correspondence Concerning Proposed Revisions to IEEE Standard 430-1976
- IEEE EMCS Standards 285-299 Ballot Comments
- IEEE EMCS Standard 187 Ballot Comments
- IEEE EMCS Standards 213-214 Ballot
- IEEE EMCS Standards Committee Meeting Materials
- IEEE EMCS Board of Directors Meeting Materials
- IEEE EMC Society Newsletter
- IEEE EMCS New Jersey Coast Section Newsletter
- The Latest Developments in Global EMC Commercial and Military Test Standards Seminar
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Repository Details
Part of the Purdue University Archives and Special Collections Repository
504 Mitch Daniels Boulevard
West Lafayette Indiana 47907 United States
765-494-2839
archives@purdue.edu